10 results
Atom-Probe Tomographic Studies of Thin Films and Multilayers
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- Journal:
- MRS Bulletin / Volume 34 / Issue 10 / October 2009
- Published online by Cambridge University Press:
- 02 March 2012, pp. 732-737
- Print publication:
- October 2009
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Overview: Recent Progress in Three-Dimensional Atom Probe Instruments and Applications
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- Journal:
- Microscopy and Microanalysis / Volume 13 / Issue 6 / December 2007
- Published online by Cambridge University Press:
- 14 November 2007, pp. 408-417
- Print publication:
- December 2007
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Atomic Scale Characterisation of Electrodeposited Nanocrystalline Ni-P Alloys
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- Journal:
- MRS Online Proceedings Library Archive / Volume 581 / 1999
- Published online by Cambridge University Press:
- 21 February 2011, 517
- Print publication:
- 1999
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Dynamical Ising Model Simulations of Nucleation and Growth in Copper-Cobalt Alloys
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- Journal:
- MRS Online Proceedings Library Archive / Volume 291 / 1992
- Published online by Cambridge University Press:
- 01 January 1992, 623
- Print publication:
- 1992
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Atom-Probe Microanalysis of Metallic Nanostructured Materials
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- Journal:
- MRS Online Proceedings Library Archive / Volume 286 / 1992
- Published online by Cambridge University Press:
- 25 February 2011, 167
- Print publication:
- 1992
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Atom Probe Studies of Interfaces in Metallic Multilayers
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- Journal:
- MRS Online Proceedings Library Archive / Volume 230 / 1991
- Published online by Cambridge University Press:
- 26 July 2012, 79
- Print publication:
- 1991
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Pulsed Laser Atom Probe Analysis of III-V Compound Semiconductor Epilayers.
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- Journal:
- MRS Online Proceedings Library Archive / Volume 160 / 1989
- Published online by Cambridge University Press:
- 28 February 2011, 439
- Print publication:
- 1989
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Application of a Position Sensitive Atom Probe to the Analysis of the Chemistry and Morphology of Multi-Quantum Well Interfaces
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- Journal:
- MRS Online Proceedings Library Archive / Volume 139 / 1989
- Published online by Cambridge University Press:
- 21 February 2011, 45
- Print publication:
- 1989
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Characterisation of Ultrafine Microstructures Using a Position-Sensitive Atom Probe (POSAP)
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- Journal:
- MRS Online Proceedings Library Archive / Volume 132 / 1988
- Published online by Cambridge University Press:
- 21 February 2011, 155
- Print publication:
- 1988
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Application of a Position Sensitive Atom Probe to the Analysis of the Chemistry and Morphology Of Multi-Quantum Well Interfaces
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- Journal:
- MRS Online Proceedings Library Archive / Volume 138 / 1988
- Published online by Cambridge University Press:
- 28 February 2011, 335
- Print publication:
- 1988
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